The Scanning Electron Microscope (SEM) used at SureScreen Scientifics is an instrument that provides high-resolution images of samples up to a usable magnification of nominally 50,000 times, which is far greater than traditional optical microscopy. The SEM provides morphological information by displaying an image of the sample surface using the main detector known as the Secondary Electron Detector (SED). The SED provides a high resolution and high depth of field image of the sample and is therefore ideal for examination of samples with varying morphology such as the fracture faces of engineering components.
The SEM also has an energy-dispersive X-ray (EDX) attachment that provides a semi-quantitative elemental breakdown of the areas being viewed. The EDX can be used for spot analysis of a specific point, an area analysis, or even by elemental mapping to see which elements are present and where. More information on the EDX facility is included in a separate white paper.